Nature

Enhancing power equipment defect identification through multi-label classification methods

Accurate identification and classification of equipment defects are essential for assessing the health of power equipment and making informed maintenance decisions. Traditional defect classification ...
Nature

A voting-based ensemble feature network for semiconductor wafer defect classification

The semiconductor manufacturing process involves complex processes that form integrated circuits on the wafer surface. Manufactured wafers are first divided according to whether they have defects or ...
Semiconductor Engineering

Using Automatic Defect Classification To Reduce The Escape Rate Of Defects

Automated optical inspection (AOI) is a cornerstone in semiconductor manufacturing, assembly and testing facilities, and as such, it plays a crucial role in yield management and process control.
Semiconductor Engineering

Achieving Zero Defect Manufacturing Part 1: Detect & Classify

Whether the discussion is about smart manufacturing or digital transformation, one of the biggest conversations in the semiconductor industry today centers on the tremendous amount of data fabs ...