The final installment in a four-part series article focuses on the inspection phase when using CAD/CAM tools to design a golf putter. CAD/CAM software used for CNC programming and simulation could ...

Applied Materials has launched a new generation of optical semiconductor wafer inspection machines that incorporate big data and AI techniques. These multimillion-dollar machines are used in chip ...

Bryn Hughes, Chief Scientist NDT, Adaptix Ltd. For as long as composite components have been made at scale, the dominant quality model has been the same: manufacture the part, then inspect it.

X-ray technology is moving into the mainstream of chip manufacturing as complex assemblies and advanced packaging make it increasingly difficult to ensure these devices will work as expected ...

AI plays a role in improving defect capture rate and distinguishing between yield-killing and nuisance defects. New developments in wafer edge inspection are proving essential to bonded wafer yields.

Over the last 20 years, food processors have become increasingly reliant on X-ray inspection equipment to identify physical contaminants in production. This is unsurprising, as X-ray inspection ...

Space Associates, Inc., a provider of advanced metrology and inspection solutions, announced new machine learning capabilities for its kSA Glass Breakage & Defect Detection tool. The enhancement adds ...